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Perovskite module durability protocol updated as US consortium targets bankability

Priya Nair ·

The U.S. Manufacturing of Advanced Perovskites Consortium on Thursday released Version 2 of its accelerated durability protocol for perovskite and perovskite silicon tandem photovoltaic modules, aiming to standardize how manufacturers and labs qualify early products. The update, coordinated by the National Renewable Energy Laboratory with partners in the Durable Modules Consortium, extends core IEC sequences with perovskite specific stresses that target ion migration, halide segregation, and contact corrosion.

The timing matters because several producers in Europe and China are moving from pilot lines to initial field deployments this year, and lenders are asking for consistent third party data before financing projects. Without harmonized tests, early modules face a patchwork of bespoke requirements that slow procurement and certification.

The protocol adds explicit combined stress tests that couple damp heat with forward bias, ultraviolet and blue light exposure with open circuit bias, and thermal cycling with humidity ingress monitoring. It defines pass and fail criteria tied to power loss, shunt resistance, spectral response, and series resistance drift, and it requires post test forensics using photoluminescence and time of flight secondary ion mass spectrometry to confirm degradation pathways.

Consortium members say the sequences build on failure mechanisms mapped in peer reviewed literature, including reports in Science from research groups at the Swiss Federal Institute of Technology in Lausanne led by Michael Grätzel and at the University of Oxford led by Henry Snaith that described light induced halide segregation and ion vacancy mediated migration. Work at the National Renewable Energy Laboratory led by Joseph Berry has also detailed interface reactions and metal contact diffusion under bias in perovskite stacks, and those effects are reflected in the new combined stresses.

The release aligns with existing IEC 61215 and 61730 module standards by referencing test equipment and safety procedures already in use at accredited labs. It also proposes a perovskite specific extension to potential induced degradation testing, since mobile ions in hybrid perovskites respond differently to high voltage fields than silicon.

Engineers get a clearer checklist for bill of materials choices and encapsulation designs, and insurers get traceable evidence for loss modeling. Policymakers seeking to translate manufacturing subsidies into deployed capacity, including under the U.S. Inflation Reduction Act and the EU Net Zero Industry Act, now have a common yardstick to require in tenders and grants without waiting for a full IEC standard to be finalized.